Patent Overlay Mapping: Visualizing Technological Distance

Authors

Newman, Nils

Ismael Rafols

Jan Youtie

Alan L. Porter

Luciano Kay

Journal/Book/Conference Name

Nanotechnology, Innovation, and Commercialization: Learning about a Technology Cycle through Patent Data, Patent Statistics for Decision Makers

Editor(s)

Month

11

Year

2011

Research Program

RTTA 1

Type

Presentation